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La popularité est une évaluation communautaire de chaque livre calculée sur une échelle de 0 à 100.

Cette évaluation repose sur une agrégation de diverses quantités qui reflètent la vie de chaque livre au sein de la communauté des lecteurs. Cette vie s'exprime en fréquence de lecture, nombre d'étagères publiques et privées dans lesquelles le livre est présent.

Un calcul 'propriétaire' mélangeant ces quantités restitue sous la forme synthétique d'un score l'aura collective du livre.

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Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.



Advances in Imaging and Electron Physics

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Volume 196

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high

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Auteur(s): Hawkes, Peter W.

Editeur: Elsevier Science

Année de Publication: 2016

pages: 370

Langue: Anglais

ISBN: 978-0-12-804812-2

eISBN: 978-0-12-805228-0

ISSN: 1076-5670

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.



  • Contains contributions from leading authorities on the subject matter
  • Informs and updates with all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Voir toute la description...